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| | Aceris-3-D
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19501 Clark Graham, Montreal, Quebec, CANADA H9X 3T1
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www.aceris-3d.ca |
- High speed 2D and 3D substrate inspection
- High speed 2D and 3D wafer inspection
- Bump inspection up to 52 200mm wafers per hour
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Viswill Visual Inspection
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DJK Global Group, Tempe AZ
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www.dja-pharma.com |
- CVIS-SXX is a high speed, highly sophisticated automatic system for
outer appearance inspection and separation of chip caps, etc.
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